FEATURE EXTRACTION AND SELECTION
Experts
- Albert Murtha
- Martin Jägersand
- Dana Cobzas
- Basavaraj S. Anami
- Kandarpa Kumar Sarma
- Geok Soon Hong
- Mikhail Belyaev
- Nadica Miljkovic
- Shawn D. Newsam
- Maxim Pisov
- David González-Patiño
- Oded Maimon
- Yi Zhu
- Mikhail Trofimov
- Amadeo José Argüelles-Cruz
- Egor Krivov
- Yenny Villuendas-Rey
- Hong Man
- A. Nur Zincir-Heywood
- Stanislav Semenov
- Shuanglu Dai
- Serge Sharoff
- J. Alberto Vázquez
- Giorgio Giacinto
- Gleb Makarchuk
- Artem Pimkin
- V. Kumar Swamy
- Jazhiel Chacón
- Jong-An Park
- Sen Jia
- Dmitry Ulyanov
- Mansour Ahmadi
- Mrityunjaya V. Latte
- Vladimir Kondratenko
- Milica S. Isakovic
- Lior Rokach
- Yoke San Wong
- Mustafizur Rahman
- Jie Sun
Venues
- CoRR
- IEEE Access
- Sensors
- Multim. Tools Appl.
- Medical Imaging: Image Processing
- ICIP
- Comput. Biol. Medicine
- IJCNN
- EMBC
- Biomed. Signal Process. Control.
- Remote. Sens.
- Neural Comput. Appl.
- Expert Syst. Appl.
- J. Intell. Fuzzy Syst.
- Int. J. Pattern Recognit. Artif. Intell.
- Pattern Recognit.
- HIS
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Geosci. Remote. Sens. Lett.
- ICIMTH
- VISAPP (1)
- EUSIPCO
- ICPR
- CASE
- Comput. J.
- Intell. Data Anal.
- SIU
- ICTAI
- EUROSPEECH
- IEEE Trans. Affect. Comput.
- Document Analysis Systems
- Int. J. Imaging Syst. Technol.
- SIGSPATIAL/GIS
- ICDM (Workshops)
- Image Vis. Comput.
- ICASSP (5)
- LREC
- Data
- ICCV
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