FEATURE EXTRACTION AND SELECTION
Experts
- Albert Murtha
- Dana Cobzas
- Basavaraj S. Anami
- Martin Jägersand
- Kandarpa Kumar Sarma
- Mikhail Belyaev
- J. Alberto Vázquez
- Yoke San Wong
- Erick Almaraz
- Dmitry Ulyanov
- Lior Rokach
- Hong Man
- Nadica Miljkovic
- Mustafizur Rahman
- Sen Jia
- Karteek Popuri
- V. Kumar Swamy
- Geok Soon Hong
- Amadeo José Argüelles-Cruz
- Maxim Pisov
- Stanislav Semenov
- Artem Pimkin
- Shuanglu Dai
- Milica S. Isakovic
- Yi Zhu
- Serge Sharoff
- Mansour Ahmadi
- Vladimir Kondratenko
- Mikhail Trofimov
- Mrityunjaya V. Latte
- Jong-An Park
- David González-Patiño
- Giorgio Giacinto
- Jie Sun
- Oded Maimon
- Jazhiel Chacón
- Yenny Villuendas-Rey
- A. Nur Zincir-Heywood
- Egor Krivov
Venues
- CoRR
- IEEE Access
- Sensors
- Multim. Tools Appl.
- Comput. Biol. Medicine
- Medical Imaging: Image Processing
- ICIP
- Remote. Sens.
- EMBC
- Neural Comput. Appl.
- Biomed. Signal Process. Control.
- IJCNN
- J. Intell. Fuzzy Syst.
- Pattern Recognit.
- Int. J. Pattern Recognit. Artif. Intell.
- Expert Syst. Appl.
- HIS
- ISBI
- ICIMTH
- Int. J. Imaging Syst. Technol.
- Document Analysis Systems
- ICPR
- Image Vis. Comput.
- IEEE Trans. Affect. Comput.
- SIU
- Data
- ICDM (Workshops)
- Intell. Data Anal.
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- ICCV
- INTERSPEECH
- SIGSPATIAL/GIS
- Comput. J.
- Clust. Comput.
- EUROSPEECH
- LREC
- IEEE Geosci. Remote. Sens. Lett.
- VISAPP (1)
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