Fault models for embedded-DRAM macros.
Mango Chia-Tso ChaoHao-Yu YangRei-Fu HuangShih-Chin LinChing-Yu ChinPublished in: DAC (2009)
Keyphrases
- fault models
- embedded dram
- random access memory
- model based diagnosis
- dynamic random access memory
- fault model
- fault management
- horn clauses
- conflict resolution
- cmos technology
- metal oxide semiconductor
- design considerations
- memory subsystem
- knowledge base
- knowledge based systems
- knowledge acquisition
- data processing
- logic programs