Tolerating Transient Faults in Statically Scheduled Safety-Critical Embedded Systems.

Nagarajan Kandasamy John P. Hayes Brian T. Murray

Published in: SRDS (1999)

Keyphrases

embedded systems
safety critical
fault diagnosis
safety analysis
low cost
fault detection
embedded software
test cases
model based diagnosis
fault model
software systems
field programmable gate array
machine learning
high level
expert systems