Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic.
David C. KeezerCarl GrayDany MinierPatrice DucharmePublished in: J. Electron. Test. (2010)
Keyphrases
- low cost
- low power
- mixed signal
- signal processing
- real time
- classical logic
- program synthesis
- digital camera
- logic synthesis
- high frequency
- test data
- non stationary
- original signal
- dual channel
- charge coupled device
- single chip
- built in self test
- multi valued
- automated reasoning
- digital media
- data acquisition
- frequency domain
- test cases
- logic programming
- neural network