Test Time Reduction on Testing Delay Faults in 3D ICs Using Boundary Scan Design.

Satoshi Hirai Hiroyuki Yotsuyanagi Masaki Hashizume

Published in: ATS (2018)

Keyphrases

test cases
built in self test
case study
user interface
knowledge based systems
test data
design process
software testing
design patterns
design principles
statistical tests