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Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability.

Kentaroh KatohKazuteru NambaHideo Ito
Published in: IPSJ Trans. Syst. LSI Des. Methodol. (2008)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • data sets
  • training set
  • test data generation
  • search based testing
  • neural network
  • computer vision
  • hidden markov models
  • software testing
  • training and test data
  • flip flops