Neural Network Model for Testing Stuck-at and Delay Faults in Digital Circuit.
Pan ZhongliangPublished in: VLSI Design (2004)
Keyphrases
- neural network model
- digital circuits
- model based diagnosis
- neural network
- test cases
- artificial neural networks
- fault model
- analog circuits
- input variables
- network architecture
- bp neural network
- multilayer perceptron
- fault diagnosis
- data flow
- rbf neural network
- fault detection
- growing neural gas
- circuit design
- finite state machines
- multi layer perceptron
- neural models
- using artificial neural networks
- functional decomposition
- hidden markov models
- high dimensional input data
- dynamic characteristics
- back propagation neural network
- np complete
- clustering algorithm