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Kinematical calculations of RHEED intensity oscillations during the growth of thin epitaxial films.
Andrzej Daniluk
Published in:
Comput. Phys. Commun. (2005)
Keyphrases
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electrical properties
chemical vapor deposition
thin film
grain size
high density
information retrieval
film thickness
image gradient
electron micrographs
image intensity
electric field
growth model
multiscale
three dimensional
image segmentation
ni fe
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