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MEMS packaging and reliability: An undividable couple.
H. A. C. Tilmans
Jeroen De Coster
P. Helin
Vladimir Cherman
A. Jourdain
P. De Moor
Bart Vandevelde
N. P. Pham
J. Zekry
Ann Witvrouw
Ingrid De Wolf
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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high speed
high density
highly reliable
reliability analysis
reliability assessment
real time
lower bound
data sets
image processing
three dimensional
similarity measure
multi agent systems
digital libraries
special case
medical images
software reliability