Test of Data Retention Faults Sensing the Bit Line with a DFT Bases Differential Amplifier.
Víctor H. ChampacVictor AvendañoGordana Jovanovic-DolecekPublished in: LATW (2001)
Keyphrases
- data sets
- data sources
- high dimensional data
- learning algorithm
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- test data
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- statistical analysis
- statistical tests
- database
- original data
- fourier transform
- fault diagnosis
- synthetic data
- data processing
- expert systems
- training data
- knowledge base
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- real time