Sign in

An enhanced time-to-digital conversion solution for pre-bond TSV dual faults testing.

Tianming NiHao ChangXian SunXia XiuzhenZhengfeng Huang
Published in: IEICE Electron. Express (2019)
Keyphrases
  • test cases
  • data conversion
  • database
  • website
  • artificial intelligence
  • fault diagnosis
  • linear equations
  • neural network
  • knowledge base
  • image processing
  • evolutionary algorithm
  • test data
  • software testing