Login / Signup

Test Set Reordering Using the Gate Exhaustive Test Metric.

Kyoung Youn ChoEdward J. McCluskey
Published in: VTS (2007)
Keyphrases
  • test set
  • test data
  • test cases
  • error rate
  • training set
  • training data
  • random selection
  • class distribution
  • training and test sets