A fast sweep-line-based failure pattern extractor for memory diagnosis.
Sin-Yu WeiBing-Yang LinCheng-Wen WuPublished in: ETS (2016)
Keyphrases
- root cause
- associative memory
- pattern matching
- model based diagnosis
- fault diagnosis
- memory usage
- pattern discovery
- neural network
- memory space
- fault detection
- medical diagnosis
- memory requirements
- main memory
- line segments
- multiple faults
- failure prediction
- pattern detection
- failure detection
- failure modes
- data sets
- repair actions
- automatic diagnosis
- memory size
- memory management
- model based reasoning
- limited memory
- computing power