Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications.
Vamsi PutchaErik BuryJacopo FrancoAmey WalkeSimeng ZhaoUthayasankaran PeralaguMing ZhaoAliReza AlianBen KaczerNiamh WaldronDimitri LintenBertrand ParvaisNadine CollaertPublished in: IRPS (2020)