Effects of different test profiles of temperature cycling tests on the reliability of RFID tags.
Sanna LahokallioKirsi Saarinen-PulliLaura FriskPublished in: Microelectron. Reliab. (2015)
Keyphrases
- rfid tags
- radio frequency identification
- low cost
- rfid systems
- test cases
- statistical tests
- lightweight
- code coverage
- post hoc
- test suite
- rfid technology
- test generation
- statistical significance
- power consumption
- security issues
- software testing
- authentication protocol
- cost effective
- user profiles
- smart card
- cellular networks
- radio frequency identification rfid
- real time