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Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets.

Yu HuangWu-Tung ChengChien-Chung TsaiNilanjan MukherjeeSudhakar M. Reddy
Published in: ISQED (2003)
Keyphrases
  • test set
  • test data
  • test cases
  • error rate
  • training data
  • training set
  • scheduling problem
  • data sets
  • data mining
  • information systems
  • feature extraction
  • pairwise
  • evaluation methodology