Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving.
Yanhong ZhouTiancheng WangHuawei LiTao LvXiaowei LiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
- constraint solving
- test generation
- constraint logic programming
- constraint propagation
- test cases
- constraint satisfaction
- constraint satisfaction problems
- test sequences
- constraint solver
- symbolic execution
- design automation
- static analysis
- quality assurance
- shortest path
- constraint programming
- software testing
- artificial intelligence
- image quality
- temporal information
- training set
- database systems
- case study
- data sets
- code coverage