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Addressing Defect Coverage through Generating Test Vectors for Transistor Defects.
Yoshinobu Higami
Kewal K. Saluja
Hiroshi Takahashi
Shin-ya Kobayashi
Yuzo Takamatsu
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2009)
Keyphrases
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defect detection
test suite
automated visual inspection
high speed
feature vectors
set of test cases
feature extraction
e learning
vector space
integrated circuit
learning algorithm
code coverage
real world
website
automatically generating
information retrieval
databases