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µs-Range Evaluation of Threshold Voltage Instabilities of GaN-on-Si HEMTs with p-GaN Gate.
Eleonora Canato
Fabrizio Masin
Matteo Borga
Enrico Zanoni
Matteo Meneghini
Gaudenzio Meneghesso
Arno Stockman
Abhishek Banerjee
Peter Moens
Published in:
IRPS (2019)
Keyphrases
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