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Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults.

Cecilia MetraStefano Di FrancescantonioMichele FavalliBruno Riccò
Published in: Microelectron. J. (2003)
Keyphrases
  • test cases
  • multiple input
  • fault model
  • flip flops
  • fault diagnosis
  • fault detection
  • power dissipation
  • computer vision
  • pattern recognition