Solving critical issues in 10nm technology using innovative laser-based fault isolation and DFT diagnosis techniques.
Lesly EndrinalRakesh KingerLavakumar RanganathanAmit ShethPublished in: IRPS (2018)
Keyphrases
- fault isolation
- diagnostic tests
- fault detection
- fault diagnosis
- physical systems
- fault tolerant
- error detection
- fault localization
- nm technology
- code generation
- fault tolerance
- decision making
- error recovery
- power consumption
- power plant
- model based diagnosis
- error correction
- complex systems
- software development
- failure detection
- low cost
- relational databases
- artificial intelligence