Special Issue on Machine Vision.

Tae-Kyun Kim Stefanos Zafeiriou Ben Glocker Stefan Leutenegger

Published in: Int. J. Comput. Vis. (2019)

Keyphrases

machine vision
special issue
quality control
image processing
ai edam
vision system
character recognition
applied intelligence
international journal
ecml pkdd
special section
imaging systems
automated visual inspection
artificial neural networks
image analysis
surface inspection
machine learning
neural network