Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST.

Florence Azaïs Serge Bernard Yves Bertrand Michel Renovell

Published in: J. Electron. Test. (2001)

Keyphrases

low cost
built in self test
low power
digital images
single chip
gray level
multiresolution
test data
data acquisition
statistical tests
search engine
high frequency
color histogram