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Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories.
Shyue-Kung Lu
Shang-Xiu Zhong
Masaki Hashizume
Published in:
J. Electron. Test. (2018)
Keyphrases
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fault diagnosis
fault tree
image enhancement
fault detection
image processing
error detection
resource allocation
foreseeable future
qualitative analysis
reliability analysis
associative memory
multi dimensional
image analysis
flash memory
expert systems
decision making
neural network