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Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.
Kohei Miyase
Kenji Noda
Hideaki Ito
Kazumi Hatayama
Takashi Aikyo
Yuta Yamato
Hiroshi Furukawa
Xiaoqing Wen
Seiji Kajihara
Published in:
ICCAD (2008)
Keyphrases
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high speed
real time
information retrieval
high quality
probability distribution
neural network
artificial intelligence
data sets
machine learning
genetic algorithm
information systems
statistical tests
automatic identification