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Challenges for Interconnect Reliability: From Element to System Level.
Olalla Varela Pedreira
Houman Zahedmanesh
Youqi Ding
Ivan Ciofi
Kristof Croes
Published in:
ISPD (2023)
Keyphrases
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higher level
real world
image processing
multimedia
high level
database systems
information technology
key issues
lower level
levels of abstraction
technical challenges
failure rate