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Testable Design of Sequential Circuits with Improved Fault Efficiency.
Debesh Kumar Das
Bhargab B. Bhattacharya
Satoshi Ohtake
Hideo Fujiwara
Published in:
VLSI Design (2001)
Keyphrases
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case study
high speed
fault diagnosis
computer aided
circuit design
data mining
logic circuits
logic synthesis
software engineering
engineering design
improved algorithm
high efficiency
fault detection
analog circuits