Coupling Electron-Beam Probing with Knowledge-Based Fault Localization.
M. MarzoukiJ. LaurentBernard CourtoisPublished in: ITC (1991)
Keyphrases
- electron beam
- fault localization
- program understanding
- x ray
- model based diagnosis
- integrated circuit
- software testing
- fault detection
- data abstraction
- design parameters
- semiconductor devices
- program slicing
- expert systems
- electron beam lithography
- constraint satisfaction
- information systems
- database management
- object oriented
- training set
- training data
- three dimensional
- genetic algorithm
- neural network