Transistor leakage fault location with ZDDQ measurement.

Xiaoqing Wen Hideo Tamamoto Kozo Kinoshita

Published in: Asian Test Symposium (1995)

Keyphrases

high speed
fault detection
fault diagnosis
integrated circuit
wavelet transform
data structure
mobile devices
data acquisition
low power
location based services
location information
physical location
fault model
single facility