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Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults.

Arijit MondalP. P. ChakrabartiPallab Dasgupta
Published in: ACM Trans. Design Autom. Electr. Syst. (2012)
Keyphrases
  • test set
  • error rate
  • training set
  • test cases
  • test data
  • training data
  • event detection
  • evaluation methodology
  • abnormal events
  • fault diagnosis
  • machine learning
  • decision trees