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Analog testing by characteristic observation inference.
Walter M. Lindermeir
Helmut E. Graeb
Kurt Antreich
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
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test cases
probabilistic inference
inference process
bayesian networks
inference engine
databases
neural network
information retrieval
information systems
probabilistic model
test data
bayesian inference
probabilistic reasoning
efficient learning
digital circuits
digital computer