Test Generation for Path Delay Faults Using Binary Decision Diagrams.

Debashis Bhattacharya Prathima Agrawal Vishwani D. Agrawal

Published in: IEEE Trans. Computers (1995)

Keyphrases

test generation
binary decision diagrams
test cases
mutation testing
boolean functions
symbolic model checking
test sequences
software testing
static analysis
planning problems
knowledge compilation
model checking
database
quality assurance
relational databases
expert systems
data sets