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Testing the Interconnect of RAM-Based FPGAs.

Michel RenovellJean-Michel PortalJoan FiguerasYervant Zorian
Published in: IEEE Des. Test Comput. (1998)
Keyphrases
  • high speed
  • machine learning
  • test cases
  • database
  • database management systems
  • test set
  • field programmable gate array
  • hardware software