A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs.
Sotirios MatakiasY. TsiatouhasAngela ArapoyanniThemistoklis HaniotakisPublished in: J. Electron. Test. (2004)
Keyphrases
- circuit design
- high speed
- analog vlsi
- delay insensitive
- cmos technology
- automatic detection
- detection accuracy
- metal oxide semiconductor
- detection method
- object detection
- power consumption
- detection rate
- real time
- low cost
- false positives
- anomaly detection
- digital circuits
- vlsi circuits
- mixed signal
- asynchronous circuits
- low voltage
- detection algorithm
- error detection
- digital media
- data sets