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Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window.
Olivier Ginez
Jean Michel Daga
Patrick Girard
Christian Landrault
Serge Pravossoudovitch
Arnaud Virazel
Published in:
VTS (2007)
Keyphrases
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statistical analysis
quantitative analysis
reliability analysis
long term
optimization problems
linear programming
benchmark problems
data sets
search engine
decision trees
multiscale
expert systems
high dimensional
low cost
solving problems