Login / Signup
A unified approach to reduce SOC test data volume, scan power and testing time.
Anshuman Chandra
Krishnendu Chakrabarty
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
</>
test data
test cases
test set
training data
search based testing
data sets
training set
testing process
software testing
power consumption
target domain
database
pairwise
evolutionary algorithm
facial expressions
training samples
genetic algorithm
low power
test suite
training and test data