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Novel gate-voltage-bias techniques for gate-coupled MOS (GCMOS) ESD protection circuits.
Guangyi Lu
Yuan Wang
Jian Cao
Song Jia
Ganggang Zhang
Xing Zhang
Published in:
ASICON (2013)
Keyphrases
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field effect transistors
cmos technology
low voltage
multiple input
flip flops
silicon dioxide
low power
leakage current
power system
nano scale
high speed
information security
high density
database
mathematical analysis