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A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters.

Chih-Wea WangRuey-Shing TzengChi-Feng WuChih-Tsun HuangCheng-Wen WuShi-Yu HuangShyh-Horng LinHsin-Po Wang
Published in: Asian Test Symposium (2001)
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