High Quality Test Vectors for Bridging Faults in the Presence of IC's Parameters Variations.

Michele Favalli Marcello Dalpasso

Published in: DFT (2007)

Keyphrases

high quality
test cases
input data
test data
higher quality
image quality
maximum likelihood
fault diagnosis
parameter settings
ground truth
expectation maximization
parameter estimation
information systems
parameter values
low quality
integrated circuit
built in self test