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Functional test generation for the pLRU replacement mechanism of embedded cache memories.
Wilson J. Pérez H.
Ernesto Sánchez
Matteo Sonza Reorda
Alberto Tonda
Jaime Velasco-Medina
Published in:
LATW (2011)
Keyphrases
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test generation
embedded processors
test cases
symbolic execution
test sequences
replacement policy
design automation
software testing
mutation testing
query processing
embedded systems
static analysis
quality assurance
short term memory
learning algorithm
database
image quality
case study