$2^{n}$ Pattern Run-Length for Test Data Compression.
Lung-Jen LeeWang-Dauh TsengRung-Bin LinCheng-Ho ChangPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
- test data
- run length
- run length encoding
- compression rate
- gray level
- test cases
- training data
- compression ratio
- test set
- pattern matching
- lossless compression
- image compression
- compression scheme
- training set
- sample size
- data sets
- texture information
- data hiding
- visual quality
- lossy compression
- training and test data
- video compression
- search based testing
- data compression
- image segmentation
- compression algorithm
- compressed images
- error correction
- video coding
- co occurrence
- decision trees