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Errors in solving inverse problem for reversing RTN effects on VCCmin shift in SRAM reliability screening test designs.
Hiroyuki Yamauchi
Worawit Somha
Published in:
SoCC (2014)
Keyphrases
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error detection
power consumption
test data
learning environment
search algorithm
sensor networks
data acquisition
low power
statistical significance
solving problems
test suite
failure rate
residual errors