RESIDUAL ERRORS
Experts
- Gang Zhao
- Bao Rong Chang
- Paul L. Bowen
- Chun-Hao Liu
- Daniel P. Lopresti
- Danijela Cabric
- A. Lee Swindlehurst
- Wenlei Xiao
- Fiona H. Rohde
- Paul Mayer
- Lorenzo Luzi
- Przemyslaw Pawelczak
- Richard G. Baraniuk
- Yehuda Dar
- Wesam Gabran
- Pengfei Zhang
- Feng-Jih Wu
- Younés Abbassi
- José Manuel García de la Vega
- Masoud Moravej Khorasani
- Hynek Hermansky
- Juin J. Liou
- Wolfgang Stuerzlinger
- Ohoud Alharbi
- Pramod Kumar Tiwari
- Vito Alberga
- Nikola N. Nikolov
- Ling Li
- Hichem Naar
- Gaspard Hiblot
- Haoji Hu
- Óscar Oballe-Peinado
- Yahui Chen
- Jacobus H. Müller
- Slaheddine Najar
- Clara Haider
- Torsten Söderström
- Yogita Sharma
- Peter Strobach
Venues
- CoRR
- Sensors
- Remote. Sens.
- IEEE Trans. Signal Process.
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- Microelectron. Reliab.
- CinC
- CDC
- IEEE Trans. Ind. Electron.
- Numerische Mathematik
- ISCAS
- J. Comput. Chem.
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- Int. J. Account. Inf. Syst.
- SIU
- Inf. Process. Manag.
- Comput. Chem. Eng.
- WREFT@CF
- Qual. Reliab. Eng. Int.
- Neurocomputing
- SIAM J. Sci. Comput.
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- COMPSTAT
- Complex.
- IEICE Trans. Inf. Syst.
- IVMSP
- RRNR
- J. ACM
- Space Commun.
- DS
- CCTA (1)
- Comput. Lang.
- MUM
- J. Chem. Inf. Model.
- OR Spectr.
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