Automated diagnosis of VLSI failures.
Paul G. RyanShishpal RawatW. Kent FuchsPublished in: VTS (1991)
Keyphrases
- failure diagnosis
- root cause
- failure detection
- automatic diagnosis
- semi automated
- signal processing
- automated analysis
- fault detection
- model based diagnosis
- semi automatic
- fault diagnosis
- high speed
- knowledge base
- information retrieval
- repair actions
- fault isolation
- early diagnosis
- attention deficit hyperactivity disorder
- database
- discrete event systems
- model based reasoning
- failure rate
- data driven
- database systems
- computer vision
- databases
- real time