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A New ATPG Method for Efficient Capture Power Reduction During Scan Testing.

Xiaoqing WenSeiji KajiharaKohei MiyaseTatsuya SuzukiKewal K. SalujaLaung-Terng WangKhader S. Abdel-HafezKozo Kinoshita
Published in: VTS (2006)
Keyphrases
  • image processing
  • highly efficient
  • probabilistic model
  • power consumption