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Experimental Analysis of Thermal Coupling in 3-D Integrated Circuits.

Ioannis SavidisBoris VaisbandEby G. Friedman
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
  • integrated circuit
  • infrared
  • power plant
  • electron beam
  • data mining
  • finite element analysis
  • thermal images
  • high temperature
  • heat transfer
  • thermal infrared