Statistical modeling and post manufacturing configuration for scaled analog CMOS.
Gokce KeskinJonathan E. ProeselLarry T. PileggiPublished in: CICC (2010)
Keyphrases
- statistical modeling
- analog vlsi
- circuit design
- statistical models
- cmos image sensor
- focal plane
- mixed signal
- predictive modeling
- high speed
- low power
- floating gate
- quality control
- analog to digital converter
- infrared
- image sensor
- low cost
- machine learning
- dynamic range
- production planning
- manufacturing systems
- power consumption
- power supply
- single chip
- digital circuits
- manufacturing processes
- manufacturing process
- raw material
- optimal configuration
- manufacturing industry
- vlsi circuits
- successive approximation