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Reliability tests for discriminating between technological variants of QFN packaging.
Marius Bazu
Virgil Emil Ilian
Dragos Varsescu
Lucian Galateanu
Vili Sikio
Meelis Reimets
Volker Uhl
Manuel Weiss
Published in:
ESSDERC (2013)
Keyphrases
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high speed
high density
highly reliable
evolutionary algorithm
failure rate
technological challenges
design process
test cases
test data
reliability assessment