Prior knowledge based fast imaging for scanning ion conductance microscopy.
Peng LiChanglin ZhangLianqing LiuYuechao WangNing XiUchechukwu C. WejinyaGuangyong LiPublished in: AIM (2013)
Keyphrases
- image analysis
- high resolution
- image processing
- fluorescence microscopy
- medical imaging
- imaging systems
- prior knowledge
- computer vision
- scan data
- single shot
- expert systems
- phase contrast images
- atomic force microscopy
- high energy
- image enhancement
- remote sensing
- three dimensional
- microscopy images
- clinical applications
- structured light