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Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers.
Yu-Jen Huang
Jin-Fu Li
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
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low cost
neural network
test cases
test data
real time
information retrieval
image sequences
steady state
semi structured
statistical tests